IMTS 2024 Conference: Intelligent Machine Learning-based Recommendations for Computed Tomography-Scanner Parameter Selection

Learn about parameter setting for CT scanners.

Intelligent Machine Learning-based Recommendations for Computed Tomography-Scanner Parameter Selection with Wayne State University and WENZEL America
GIE Media's Manufacturing Group

Monday September 9 3:15 PM CST
IMTS13 Room W192-A

About the presentation
Computed Tomography (CT) scanning, as a quality inspection technology, has traditionally been used by manufacturers off-line or in high value/very low volume scenarios due to the considerable time investment needed to gather, process, and analyze data. Increasing the integration of CT scanners in manufacturing environments can provide detailed internal and external digital records of production parts not achievable with current inspection technologies, but this requires the CT scanning process to be less operator-dependent and more traceable. CT scanning pre-scan parameter setting, scanning, and post-scan data processing and analysis can potentially be improved through new computational capabilities, artificial intelligence/machine learning algorithms, and data processing/analysis structures. This paper proposes a machine learning-based recommender system to recommend CT scanning parameters that provide feasible scans, reducing the amount of operator-based scan parameter searching. Since the critical element of this system is a machine learning model that predicts scan feasibility, the developed recommender's performance is evaluated by its ability to predict scan parameters that lead to feasible scans. The accuracy of four machine learning methods on predicting scan feasibility are compared. The multi-layer perceptron approach accurately predicted scan feasibility, with an accuracy range of 0.979 to 0.992, surpassing the other three methods. However, since multi-layer perceptron does not elucidate on the prediction model behavior, a game theoretic approach was utilized to explain the predictions provided by the model. Finally, a two-part experiment to evaluate the performance of the recommender system demonstrated its effectiveness on both familiar and unfamiliar materials.

Meet your presenter
Neda Sayahi is a PhD candidate in Industrial Engineering at Wayne State University, Detroit, Michigan, with a strong academic background from the University of Tehran, Iran, in Operation Research and Industrial Management. Her research primarily focuses on data science, predictive analytics, and machine learning applications in manufacturing. Neda has contributed to several academic publications in these areas and is actively involved in teaching and mentoring roles at Wayne State University. Her dedication to her field is reflected in her consistent academic achievements.