Measurement system provides accurate non-contactanalysis for process control and QA applications

The VIEW Pinnacle is a large format, non-contact dimensional measurement system for high volume, high capacity operation in production environments ranging from clean rooms to factory floors.


The VIEW Pinnacle is a large format, non-contact dimensional measurement system for high volume, high capacity operation in production environments ranging from clean rooms to factory floors. Featuring a precision granite base and column, passive vibration isolation system, noncontact stage encoders, and linear motors with acceleration and velocity performance, Pinnacle encompasses advanced technologies to provide accurate inspection throughput, with quality mean time between failure (MTBF) performance. This precision metrology system is specially designed for dimensional measurement applications requiring high levels of accuracy and reliability. Its dual-magnification optical system uses two cameras for near instantaneous magnification changes. Multi-color LED illumination systems allow use of monochromatic red, green, blue, or white light for the high resolution imaging of applications. The VIEW Pinnacle features a measuring range of 250 x 165 x 100 mm (XYZ), an accuracy of E2 (XY plane) = (1.0 + 5L/1000) µm and resolution to 0.1 µm (0.000004 in.). Applications for Pinnacle include BGA, µBGA, CSP, flip-chip, MCM, bump-on-die, lead frames, solder paste, chip carriers and more. VIEW Pinnacle is ESD and Class 1000 clean room compatible.

View Engineering, Inc. Simi Valley, CA viewengineering.com Booth #D-4618

July August 2006
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